Transistor Reliability Request

Reliability Data is created to provide the reliability engineer with Median Time To Failure (MTTF) and FIT estimates. Reliability Data is based off of the results of acceleration life testing and is performed to help give reliability predictions and life estimates for any specific component series. Please complete the form to your right and we will respond as soon as possible.

DATA INCLUDED:
  • Series tested
  • Test conditions used
  • Acceleration factor calculation
  • Confidence level of reliability testing


RELIABILITY DATA REQUEST

This site uses cookies to improve your experience. By clicking, you agree to our Privacy Policy.