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Ceramic Capacitor Reliability Data Request

Ceramic Capacitors Reliability Data



Reliability Data is created to provide the reliability engineer with Median Time To Failure (MTTF) and FIT estimates. Reliability Data is based off of the results of acceleration life testing and is performed to help give reliability predictions and life estimates for any specific component series. Please complete the form to your right and we will respond as soon as possible.


 

Data Included:

  • Series tested

  • Test conditions used

  • Acceleration factor calculation

  • Confidence level of reliability testing

 

Reliability Data Available for Ceramic Capacitors:

High-Q (HQN Series)

High-Q Ceramic Capacitors have excellent Q and low ESR performance at high frequencies. They are suitable for IC decoupling applications.

High Voltage (HVC Series)

High Voltage Ceramic Capacitors are designed and manufactured to meet requirements for numerous high voltage applications.

Low Inductance (LIC Series)

Low Inductance Capacitors (LIC) has its terminations on the longer sides of its rectangular shape (as opposed to the shorter side in a standard ceramic capacitor).

General Purpose (C Series)

Ceramic Capacitors are made up of a monolithic structure which provides excellent long term reliability, and come in a wide variety of case sizes and dielectrics.

Reliability Data Request 

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